The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11061750 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 13, 2021

Filed:

Sep. 06, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Philip R. Chauvet, Tucson, AZ (US);

David C. Reed, Tucson, AZ (US);

Franklin E. McCune, Tucson, AZ (US);

Keith R. Smith, Orlando, FL (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G11B 27/32 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0751 (2013.01); G06F 11/073 (2013.01); G11B 27/327 (2013.01); G11B 27/328 (2013.01); G11B 27/329 (2013.01);
Abstract

A method for analyzing data corruption is disclosed. In one embodiment, such a method includes identifying a data set to analyze for data corruption. This data set resides on tracks of a volume. The method further determines, from control information associated with the volume, on which tracks of the volume the data set resides. The method reads content of the data set without opening the data set by performing full-track reads of the tracks. The method further determines an expected format of the content by analyzing the control information. An actual format of the content is compared to the expected format to identify areas of the data set that may be corrupt. A corresponding system and computer program product are also disclosed.


Find Patent Forward Citations

Chauvet, Philip. (2021). Corrupted track analyzer (U.S. Patent No. 11061750). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11061750

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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