The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2021

Filed:

Apr. 24, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Philip Jacob, Congers, NY (US);

Philip Neil Strenski, Yorktown Heights, NY (US);

Charles Johns, Austin, TX (US);

Lars Schneidenbach, Bedford Hills, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 9/30 (2018.01); G06F 12/0806 (2016.01); G06F 13/16 (2006.01);
U.S. Cl.
CPC ...
G06F 9/30036 (2013.01); G06F 9/30043 (2013.01); G06F 12/0806 (2013.01); G06F 13/1673 (2013.01);
Abstract

Scatter gather operation(s) are performed by accessing a shared memory that is shared amongst nodes interconnected through network(s) and having a CNS shared amongst the nodes. Data is gathered from multiple processes at corresponding multiple nodes into location(s) in the CNS, and tuple(s) having a same tuple name are created in the CNS. The tuple(s) have information referencing the gathered data in the location(s). Alternatively, data that has been gathered using the same tuple name is scattered to multiple processes participating in the CNS. The scattering uses the tuple(s) in the CNS, and is performed from the location(s) into other location(s) at one or multiple nodes for one or multiple processes at the corresponding one or multiple nodes. Both the gathering data and the scattering data may also be performed.


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