The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2021

Filed:

Jan. 07, 2019
Applicant:

Vast Data Ltd., Tel Aviv, IL;

Inventors:

Renen Hallak, Tenafly, NJ (US);

Asaf Levy, Tel Aviv, IL;

Avi Goren, Tel Aviv, IL;

Vladimir Zdornov, Kfar Saba, IL;

Assignee:

Vast Data Ltd., Tel Aviv, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01); G06F 3/06 (2006.01); G06F 11/14 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0608 (2013.01); G06F 3/064 (2013.01); G06F 3/067 (2013.01); G06F 3/0631 (2013.01); G06F 11/1407 (2013.01); G06F 11/1451 (2013.01); G06F 11/3034 (2013.01); G06F 2201/835 (2013.01); G06F 2201/84 (2013.01); G06F 2201/88 (2013.01);
Abstract

A system and method for efficiently providing snapshots in storage systems. The method includes creating a plurality of snaplines for a storage system, each snapline having metadata including a timestamp and a status marker for each of a plurality of offset ranges, wherein each offset range corresponds to data stored in the storage system, the storage system including a plurality of compute nodes, wherein the timestamp of each snapline is a value of a global counter at a time of creation of the snapline, wherein the global counter is uniform among the plurality of compute nodes; and creating a snapshot based on the plurality of snaplines and a time value, wherein the snapshot indicates a snapline of the plurality of snaplines that is not to be deleted, wherein the timestamp of the snapline that is not to be deleted corresponds to the time value.


Find Patent Forward Citations

Hallak, Renen. (2021). Method and system for providing improved efficiency snapshots using snaplines (U.S. Patent No. 11061569). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11061569

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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