The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2021

Filed:

Dec. 03, 2018
Applicant:

Siemens Aktiengesellschaft, Munich, DE;

Inventors:

Thomas Kahabka, Hersbruck, DE;

Johannes Mueller, Nuremberg, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G01D 9/00 (2006.01); G05B 19/042 (2006.01); G05B 19/05 (2006.01); G05B 9/03 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0256 (2013.01); G01D 9/005 (2013.01); G05B 9/03 (2013.01); G05B 19/0428 (2013.01); G05B 19/058 (2013.01); G05B 23/0237 (2013.01); G05B 2219/1187 (2013.01); G05B 2219/24184 (2013.01); G05B 2219/24196 (2013.01);
Abstract

A method for error-protected acquisition of a measured value in a control unit, wherein the measured value is firstly acquired with a first acquisition device and secondly with a second acquisition device and thereby a first measured value and a second measured value are made available, where in a comparison step in a safety program executing in the control unit, the first and the second measured value are compared with one another for a deviation from one another and upon reaching or exceeding a pre-determined maximum deviation, an error is identified.


Find Patent Forward Citations

Kahabka, Thomas. (2021). Automation system and method for error-protected acquisition of a measured value (U.S. Patent No. 11061391). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11061391

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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