The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2021
Filed:
Jan. 02, 2019
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Benjamin Giles Lee, Ridgefield, CT (US);
Nicolas Dupuis, New York, NY (US);
Jonathan E. Proesel, Mount Vernon, NY (US);
Assignee:
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/01 (2006.01); G02F 1/225 (2006.01); G02F 1/21 (2006.01);
U.S. Cl.
CPC ...
G02F 1/0147 (2013.01); G02F 1/0121 (2013.01); G02F 1/225 (2013.01); G02F 1/212 (2021.01); G02F 1/215 (2021.01); G02F 2203/50 (2013.01);
Abstract
Techniques that facilitate control of dual phase tuners are provided. In one example, a system includes a first phase tuner and a second phase tuner. The first phase tuner is driven to a first phase bias that is different than a desired phase bias for an interferometer. The second phase tuner is driven to a second phase bias. A combination of the first phase bias and the second phase bias corresponds to the desired phase bias.