The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2021
Filed:
Apr. 05, 2018
Raytheon Company, Waltham, MA (US);
Huy P. Nguyen, Waltham, MA (US);
Elliot Schwartz, Waltham, MA (US);
Eric Blake, Waltham, MA (US);
Pradyumna Kannan, Waltham, MA (US);
Raytheon Company, Waltham, MA (US);
Abstract
A target intercept system for guiding an interceptor to a target using passive ranging includes an EO/IR sensor that provides target azimuth and elevation angles, target irradiance, target area and target length. A dual Kalman Filter architecture is implemented where, prior to a target image becoming resolved, i.e., prior to endgame, a first Kalman Filter provides guidance as a function of target azimuth and elevation angles and target irradiance measurements. After the target image becomes resolved, i.e., at endgame, a second Kalman Filter provides guidance as a function of target azimuth and elevation angles, target area and, optionally, target length, instead. The dual Kalman Filter approach improves the estimates of time-to-go by optimizing the on-board EO/IR sensor measurements at the optimal times.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile