The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2021

Filed:

Feb. 09, 2018
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventor:
Assignee:

Koninklijke Philips N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/565 (2006.01); G01R 33/48 (2006.01); G01R 33/561 (2006.01); G01R 33/563 (2006.01);
U.S. Cl.
CPC ...
G01R 33/56554 (2013.01); G01R 33/4828 (2013.01); G01R 33/5616 (2013.01); G01R 33/56341 (2013.01);
Abstract

A magnetic resonance (MR) imaging system includes a memory for storing machine executable instructions and preparation pulse sequence commands. The preparation pulse sequence commands are configured to control the system to acquire the preliminary MR data as a first data portion and a second data portion; to generate a first bipolar readout gradient during acquisition of the first portion; and to generate a second bipolar readout gradient during acquisition of the second portion, wherein the first bipolar readout gradient has an opposite polarity to the second bipolar gradient. The system is further configured to calculate a measured normalised phase correction quantity in image space using the first and second data portions; and fit a modeled phase correction to the measured phase error, wherein modeled phase correction is an exponential of a complex value multiplied by a phase error function that is spatially dependent.


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