The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2021
Filed:
Dec. 01, 2017
Albert-ludwigs-universitat Freiburg, Freiburg, DE;
Ali Caglar Ozen, Freiburg, DE;
Michael Bock, Heidelberg, DE;
Albert-Ludwigs-Universität Freiburg, Freiburg, DE;
Abstract
A method for the magnetic resonance examination of a measurement object is described, in which a measurement sequence is used in which the magnetic resonance response to the transmitted signal during transmission is measured. It is provided that a correction signal corresponding to the transmitted signal be generated and be used for correction of the response signal. To this end, the correction signal is modulated by a phase value and an amplitude value. The phase value and the amplitude value are automatically and iteratively customized for optimum correction of the response signal by an optimization method using a respective present state value of the measurement signal. Further, a radio-frequency unit () is described that can be used to carry out the method according to the invention.