The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2021
Filed:
Jul. 28, 2017
Applicants:
Electricite DE France, Paris, FR;
Institut Natitonal DE Recherche En Informatique ET En Automatique, Rocquencourt, FR;
Inventors:
Nassif Berrabah, Moret-sur-Loing, FR;
Qinghua Zhang, Cesson-Sevigne, FR;
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/08 (2020.01); G01R 27/06 (2006.01); G01R 27/32 (2006.01); G01R 31/44 (2020.01); G01R 31/58 (2020.01); H04B 3/46 (2015.01);
U.S. Cl.
CPC ...
G01R 31/083 (2013.01); G01R 27/06 (2013.01); G01R 27/32 (2013.01); G01R 31/08 (2013.01); G01R 31/44 (2013.01); G01R 31/58 (2020.01); H04B 3/46 (2013.01);
Abstract
The present invention relates to a method for diagnosing defects on a cable, including the following steps: measuring parameters S of the cable; determining the apparent impedance of the cable as a function of the position z along the cable, from one end of the cable Z(z), as well as from the other end of the cable Z(z); determining an estimation of the linear resistance R(z) of the cable as a function of the position z along the cable; and detecting a defect on a cable when the estimated linear resistance R(z) deviates from a reference value.