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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11060992 B1

PDFFull Text
Date of Patent:
Jul. 13, 2021

Filed:

Mar. 24, 2017

Probe heater remaining useful life determination

Applicant:

Rosemount Aerospace Inc., Burnsville, MN (US);

Inventors:

Ben Ping-Tao Fok, Rosemount, MN (US);

Thomas Wingert, Rosemount, MN (US);

Assignee:

Rosemount Aerospace Inc., Burnsville, MN (US);

Attorney:

Kinney & Lange, P. A.

Primary Examiner:

Huy Q Phan

Assistant Examiner:

David B Frederiksen

Int. Cl.
CPC ...
G01N 27/20 (2006.01); G01R 31/00 (2006.01); H05B 3/44 (2006.01); G01R 19/32 (2006.01); G01N 27/24 (2006.01); G01J 5/02 (2006.01); B64D 15/12 (2006.01); B64D 45/00 (2006.01); G01K 15/00 (2006.01); H05B 3/56 (2006.01); G01K 13/02 (2021.01); G01P 13/02 (2006.01); H05B 1/02 (2006.01); G01P 5/165 (2006.01); G01J 5/00 (2006.01);
U.S. Cl.
CPC ...
G01N 27/20 (2013.01); B64D 15/12 (2013.01); B64D 45/00 (2013.01); G01J 5/025 (2013.01); G01K 13/028 (2013.01); G01K 15/007 (2013.01); G01N 27/24 (2013.01); G01P 5/165 (2013.01); G01P 13/025 (2013.01); G01R 19/32 (2013.01); G01R 31/008 (2013.01); H05B 1/0236 (2013.01); H05B 3/44 (2013.01); H05B 3/56 (2013.01); B64D 2045/0085 (2013.01); G01J 2005/0077 (2013.01); H05B 2214/02 (2013.01);
Abstract

A probe system includes a heater and a control circuit. The heater includes a resistive heating element routed through the probe. An operational voltage is provided to the resistive heating element to provide heating for the probe. The control circuit is configured to provide a test voltage different than the operational voltage and monitor a test current generated in the resistive heating element while providing the test voltage. The control circuit is further configured to detect micro fractures in the resistive heating element based on the test current.

Find Patent Forward Citations

Fok, Ben Ping-Tao. (2021). Probe heater remaining useful life determination (U.S. Patent No. 11060992). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11060992

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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