The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2021
Filed:
Apr. 23, 2019
Canon Medical Systems Corporation, Otawara, JP;
Yujie Lu, Vernon Hills, IL (US);
Zhou Yu, Wilmette, IL (US);
Richard Thompson, Hawthorn Woods, IL (US);
Canon Medical Systems Corporation, Otawara, JP;
Abstract
X-ray scatter simulations to correct computed tomography (CT) data can be accelerated using a non-uniform discretization of the RTE, reducing the number of computations without sacrificing precision. For example, a coarser discretization can be used for higher-order/multiple-scatter flux, than for first-order-scatter flux. Similarly, precision is preserved when coarser angular resolution is used to simulate scatter within a patient, and finer angular resolution used for the scatter flux incident on detectors. Finer energy resolution is more beneficial at lower X-ray energies, and coarser spatial resolution can be applied to regions exhibiting less X-ray scatter (e.g., air and regions with low radiodensity). Further, predefined non-uniform discretization can be learned from scatter simulations on training data (e.g., a priori compressed grids learned from non-uniform grids generated by adaptive mesh methods).