The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2021

Filed:

Sep. 01, 2017
Applicant:

Elichens, Grenoble, FR;

Inventor:

Yanis Caritu, Saint-Joseph-de-Riviere, FR;

Assignee:

ELICHENS, Grenoble, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/3504 (2014.01); G01J 3/10 (2006.01); G01J 3/42 (2006.01); G01N 21/31 (2006.01); G01N 21/359 (2014.01); G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
G01N 21/3504 (2013.01); G01J 3/10 (2013.01); G01J 3/108 (2013.01); G01J 3/42 (2013.01); G01N 21/314 (2013.01); G01N 21/3151 (2013.01); G01N 21/359 (2013.01); G01J 2003/2866 (2013.01);
Abstract

The invention relates to a method for analyzing gas by an optical method, according to which a gas sample, comprising gaseous species for which it is desired to determine the quantity, is subjected to an illuminating radiation generated by a light source. The method comprises detecting a radiation having crossed the gas, by means of a light sensor. According to the invention, the light source produces different successive illuminations, such that at each illumination, the spectrum of the illuminating radiation varies. During each illumination, the intensity of the radiation detected by the light sensor is recorded. A processor can estimate a quantity of each gaseous species as a function of the respective intensities measured during each illumination. The invention also relates to a gas analysis device implementing the method.


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