The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2021
Filed:
Sep. 07, 2018
Lg Chem, Ltd., Seoul, KR;
An-Soo Jeong, Daejeon, KR;
Nam-Won Kim, Daejeon, KR;
Young-Tae Kim, Daejeon, KR;
Pil-Kyu Park, Daejeon, KR;
Han-Gab Song, Daejeon, KR;
Min-Gyu Kim, Daejeon, KR;
Abstract
Apparatus and methods of evaluating brittleness by measuring force applied to an electrode specimen by simulating a wound state of a jelly-roll type electrode assembly are disclosed herein. In an embodiment, a brittleness evaluation apparatus includes a jig unit, a driving unit, and a measurement analyzing unit. The jig unit includes two jigs, a groove formed between the jigs, a pressing plate, and guides. The jigs facing each other and have top surfaces formed in a horizontal plane and configured to receive a specimen arranged on the top surfaces along a length direction extending between and along the top surfaces. The pressing plate is arranged perpendicular to the length direction and configured to cause the specimen to bend by descending into the groove. The guides are located on each of the top surfaces of the jigs and configured to prevent distortion of the specimen during descent of the pressing plate.