The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2021

Filed:

Jul. 03, 2019
Applicants:

Takuroh Sone, Kanagawa, JP;

Takafumi Hiroi, Tokyo, JP;

Takashi Soma, Kanagawa, JP;

Shuhei Watanabe, Chiba, JP;

Hideyuki Kihara, Kanagawa, JP;

Inventors:

Takuroh Sone, Kanagawa, JP;

Takafumi Hiroi, Tokyo, JP;

Takashi Soma, Kanagawa, JP;

Shuhei Watanabe, Chiba, JP;

Hideyuki Kihara, Kanagawa, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/50 (2006.01); G06T 7/136 (2017.01); G06T 7/11 (2017.01); G01J 3/02 (2006.01); G01J 3/42 (2006.01); G01N 21/57 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G01J 3/504 (2013.01); G01J 3/021 (2013.01); G01J 3/42 (2013.01); G01N 21/57 (2013.01); G06T 7/0008 (2013.01); G06T 7/11 (2017.01); G06T 7/136 (2017.01); G01J 2003/425 (2013.01); G06T 2207/10024 (2013.01);
Abstract

An evaluating method includes obtaining, by an imaging device, a two-dimensional reflected light amount distribution of a surface of a target; classifying, by one or more processors, the surface into a plurality of areas on the basis of chromaticity information of the two-dimensional reflected light amount distribution; and evaluating, by one or more processors, appearance characteristics of the target on the basis of respective sets of chromaticity information of the areas.


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