The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2021

Filed:

Dec. 20, 2017
Applicants:

Hidetaka Noguchi, Hyogo, JP;

Junichi Azumi, Miyagi, JP;

Hidenori Kato, Hyogo, JP;

Masashi Suematsu, Hyogo, JP;

Masayuki Fujishima, Kanagawa, JP;

Shuichi Suzuki, Osaka, JP;

Inventors:

Hidetaka Noguchi, Hyogo, JP;

Junichi Azumi, Miyagi, JP;

Hidenori Kato, Hyogo, JP;

Masashi Suematsu, Hyogo, JP;

Masayuki Fujishima, Kanagawa, JP;

Shuichi Suzuki, Osaka, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/02 (2006.01); G01J 3/18 (2006.01);
U.S. Cl.
CPC ...
G01J 3/021 (2013.01); G01J 3/0259 (2013.01); G01J 3/0289 (2013.01); G01J 3/18 (2013.01);
Abstract

(Object) To enable to provide a small-scale and low-cost spectrometer (Means of Achieving the Object) A spectrometer includes: a light incidence unit configured to allow incidence of light from outside; a diffraction grating configured to disperse, according to wavelength, the light that is incident through the light incidence unit; and a reflection unit including a reflection surface for reflecting the light that has been dispersed according to wavelength by the diffraction grating. Tilt of the reflection surface is changeable.


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