The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2021
Filed:
May. 29, 2018
Duke University, Durham, NC (US);
Joseph Batton Andrews, Durham, NC (US);
Martin Brooke, Hillsborough, NC (US);
Aaron Franklin, Cary, NC (US);
DUKE UNIVERSITY, Durham, NC (US);
Abstract
A method of measuring thickness of a material generally includes applying an oscillating signal to a first electrode at a fixed frequency, passing the signal through the material to a second electrode, and measuring the magnitude of the signal reflected back to the first electrode. The thickness of the material is determined based on the measured magnitude of the reflected signal by: 1) comparing the determined magnitude to a predetermined baseline to establish a difference; and 2) identifying the thickness based on the difference. Related apparatuses are also disclosed. The material may be a vehicle tire.