The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2021
Filed:
Jul. 01, 2016
Applicant:
Komatsu Industries Corporation, Kanazawa, JP;
Inventor:
Takahiko Kurokawa, Nonoichi, JP;
Assignee:
KOMATSU INDUSTRIES CORPORATION, Kanazawa, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B30B 15/28 (2006.01); B30B 15/14 (2006.01); B30B 1/26 (2006.01); B30B 15/10 (2006.01); H01H 47/00 (2006.01);
U.S. Cl.
CPC ...
B30B 15/28 (2013.01); B30B 1/266 (2013.01); B30B 15/10 (2013.01); B30B 15/14 (2013.01); B30B 15/148 (2013.01); H01H 47/002 (2013.01);
Abstract
A press system includes a detection unit configured to detect occurrence of an abnormality during press working for a workpiece, and an abnormality determination unit configured to determine an abnormality level, based on the abnormality detected by the detection unit and a stoppage period for which a pressing operation is stopped after occurrence of the abnormality.