The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2021
Filed:
Dec. 19, 2017
Mayo Foundation for Medical Education and Research, Rochester, MN (US);
Kenneth A. Fetterly, Spring Valley, MN (US);
Christopher P. Favazza, Rochester, MN (US);
Mayo Foundation for Medical Education and Research, Rochester, MN (US);
Abstract
Systems and methods for correcting images acquired with an imaging system for measurement bias from non-stationary noise in model observers are described. A biased detectability index is estimated from signal present and signal absent condition images and an estimate of the bias from non-stationary noise is also estimated. This bias is then removed from the detectability index to provide an assessment of detectability of the imaging system.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile