The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2021
Filed:
May. 19, 2017
Perimeter Medical Imaging, Inc., Toronto, CA;
David Rempel, Toronto, CA;
Andrew Berkeley, Woodstock, CA;
Elizabeth Alice Munro, Toronto, CA;
Yaaseen Atchia, Toronto, CA;
PERIMETER MEDICAL IMAGING, INC., Toronto, CA;
Abstract
Various embodiments are described herein for a system and method of integrated X-ray imaging and microscopic imaging of an imaging area having a sample on a sample stage. An X-ray apparatus may be disposed within the imaging area and be configured to acquire X-ray image data of at least a portion of the sample. A microscopic imaging apparatus may be disposed within the imaging area and be configured to acquire microscopic image data of the at least a portion of the sample. In some embodiments, a processing unit may then control the X-ray apparatus to acquire X-ray image data of the at least the portion of the sample, and generate one or more corresponding X-ray images; determine a region of interest (ROI) of the sample based on the one or more X-ray images; and control the microscopic imaging apparatus to obtain at least one microscopic image based on the ROI.