The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2021
Filed:
Oct. 26, 2017
Koninklijke Philips N.v., Eindhoven, NL;
Jens Von Berg, Hamburg, DE;
Stewart Young, Hamburg, DE;
Daniel Bystrov, Hamburg, DE;
Nataly Wieberneit, Hamburg, DE;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
The present invention relates to an apparatus for the detection of opacities in X-ray images. It is described to provide () an analysis X-ray image of a region of interest of an analyzed body part. A model of a normal region of interest is provided (), wherein the model is based on a plurality of X-ray images of the region of interest. At least one abnormality is detected () in the region of interest of the analyzed body part, the detection comprising comparing the analysis X-ray image of the region of interest and the model of the normal region of interest. Information is output () on the at least one abnormality.