The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2021

Filed:

Dec. 05, 2019
Applicant:

Siemens Healthcare Gmbh, Erlangen, DE;

Inventors:

Thomas Flohr, Uehlfeld, DE;

Bernhard Schmidt, Fuerth, DE;

Assignee:

Siemens Healthcare GmbH, Erlangen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01); A61B 6/00 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/032 (2013.01); A61B 6/482 (2013.01); A61B 6/504 (2013.01); A61B 6/5205 (2013.01); G06T 11/005 (2013.01); G06T 2211/404 (2013.01);
Abstract

An X-ray imaging method is for generating image data of a field of view of an object to be examined. In the method, firstly an individual imaging protocol is determined for imaging of the object to be examined. Furthermore, first X-ray projection measurement data with a first X-ray energy spectrum and at least one set of second contrast medium-influenced X-ray projection measurement data with a second X-ray energy spectrum, are acquired from the field of view. A third X-ray energy spectrum with a third mean energy is then determined on the basis of the determined individual imaging protocol. Subsequently, preferably pseudo-monoenergetic image data, associated with the third X-ray energy spectrum, is reconstructed on the basis of the acquired first and at least second X-ray projection measurement data as well as the determined imaging protocol. An image data-generating device is also described. A computerized tomography system is described, moreover.


Find Patent Forward Citations

Loading…