The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 2021

Filed:

Feb. 06, 2017
Applicant:

Nanjing Howso Technology Co., Ltd, Jiangsu, CN;

Inventors:

Donghua Wu, Jiangsu, CN;

Alexis Huet, Vitry-aux-Loges, FR;

Lulu Shi, Jiangsu, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/08 (2009.01); G06N 20/00 (2019.01); H04L 12/24 (2006.01); H04L 12/26 (2006.01); H04W 24/04 (2009.01); H04W 24/06 (2009.01);
U.S. Cl.
CPC ...
H04W 24/08 (2013.01); G06N 20/00 (2019.01); H04L 41/147 (2013.01); H04L 43/16 (2013.01); H04W 24/04 (2013.01); H04W 24/06 (2013.01);
Abstract

A method and system for detecting abnormal values in an LTE network is provided: dividing measured data into a training and a testing set; defining clusters and parameters in the training set, and finding the cluster to which each point belongs using clustering algorithms; calculating a likelihood of each point based on parameters and clustering results; assigning the likelihood into an abnormal, an intermediate or a normal region according to a set warning and alarming threshold; and applying a calculated model to the testing set, the likelihood of each point is calculated and assigned to a region, thereby finding abnormal values in the testing set. The variation of data points versus time may be better understood by introducing time axes into the model, thereby multiple abnormal values may be discovered from a sequence of multiple points. The method can immediately detect abnormal values and the error rate is low.


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