The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 2021
Filed:
Feb. 18, 2020
Fraunhofer-gesellschaft Zur Foerderung Der Angewandten Forschung E.v., Munich, DE;
Tobias Schoen, Nuremberg, DE;
Wolfgang Holub, Fuerth, DE;
Daniel Stromer, Hoechstadt, DE;
Andreas Maier, Erlangen, DE;
Gisela Anton, Erlangen, DE;
Michel Thilo, Nuremberg, DE;
Martin Vossiek, Fuerth, DE;
Jan Schuer, Langensendelbach, DE;
Abstract
The invention refers to a system for analyzing a document. Each of two measurement arrangements includes two components being a radiation source and a radiation detector, respectively. The two measurement arrangements provide measurement data and differ from each other with regard to a measurement principle, a kind of radiation source, a kind of radiation detector, a kind of relative movement between the document and a component, a kind of relative arrangement of the two components to each other, a kind of emitted radiation, a kind of received radiation or a kind of processing information about radiation emitted by the respective radiation source and/or about radiation received by the respective radiation detector. An evaluator provides data based on the measurement data. The invention also refers to a corresponding method.