The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 2021

Filed:

Aug. 26, 2019
Applicant:

Keysight Technologies, Inc., Santa Rosa, CA (US);

Inventors:

Ya Jing, Beijing, CN;

Hong-Wei Kong, Beijing, CN;

Zhu Wen, Beijing, CN;

Assignee:

Keysight Technologies, Inc., Santa Rosa, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/10 (2006.01); H04B 17/10 (2015.01);
U.S. Cl.
CPC ...
H04B 17/102 (2015.01); G01R 29/10 (2013.01);
Abstract

A method for testing an antenna array uses a probe antenna to measure an RF signal antenna pattern of the antenna array. The method includes measuring the RF signal antenna pattern at a first position and at a second position relative to the antenna array. The first position and the second position are located at different distances from the antenna array in a middle field of the antenna array. The middle field satisfies near field criteria for the antenna array and also satisfies far field criteria for each antenna element of the plurality of antenna elements in the antenna array. The method further includes determining, based on the first measurement and based on the second measurement, the RF signal antenna pattern at a third position relative to the antenna array located in a far field of the antenna array.


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