The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 2021

Filed:

Mar. 04, 2020
Applicant:

Mitsubishi Electric Research Laboratories, Inc., Cambridge, MA (US);

Inventors:

koon Hoo Teo, Lexington, MA (US);

Nadim Chowdhurry, Cambridge, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/778 (2006.01); H03K 19/20 (2006.01); H01L 29/20 (2006.01); H01L 29/205 (2006.01); G06N 10/00 (2019.01); H01L 21/306 (2006.01); H01L 29/66 (2006.01); H03K 19/0952 (2006.01); H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7786 (2013.01); G06N 10/00 (2019.01); H01L 21/0254 (2013.01); H01L 21/30621 (2013.01); H01L 29/2003 (2013.01); H01L 29/205 (2013.01); H01L 29/66462 (2013.01); H03K 19/0952 (2013.01); H03K 19/20 (2013.01);
Abstract

An OR-gate device includes two cross shaped structures, each cross shaped structure includes a channel. Where at an end of each channel is an ohmic contact connecting the two cross shaped structures. Each cross shaped structure includes an epitaxial layer including a III-N heterostructure such as InAlN/GaN. Wherein an amount of an In concentration of the InAlN/GaN is tuned to lattice match with GaN, resulting in electron mobility to generate ballistic electrons. A fin structure located in the channel includes a gate formed transversely to a longitudinal axis of the channel. The gate is controlled using a voltage over the fin structure. Wherein the fin structure is formed to induce an energy-field structure that shifts by an amount of the voltage to control an opening of the gate that the flow of ballistic electrons is passing through, which in turn changes a depletion width, subjecting the ballistic electrons to interference.


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