The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 2021

Filed:

May. 31, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Jianying Hu, Bronx, NY (US);

Kenney Ng, Arlington, MA (US);

Adam Perer, Pittsburgh, PA (US);

Fei Wang, Ossining, NY (US);

Yajuan Wang, White Plains, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G16H 10/60 (2018.01); G16H 50/30 (2018.01); G16H 50/20 (2018.01);
U.S. Cl.
CPC ...
G16H 10/60 (2018.01); G16H 50/20 (2018.01); G16H 50/30 (2018.01);
Abstract

Aspects of the present invention include a method, system and computer program product. The method includes identifying, by a processor, a set of global risk factors for a target event using training patients, and providing, by the processor, a disease progression timeline with defined time stamps by aligning longitudinal data of the training patients based on the defined time stamp of risk targets. The method also includes positioning, by the processor, a target patient at one of the defined time stamps on the disease progression timeline, and identifying, by the processor, at least one of the training patients similar to the target patient with the same one of the defined time stamps on the disease progression timeline. The method further includes calculating, by the processor, a time-varying predictive pattern of at least a portion of the global set of risk factors for the target patient along the disease progression timeline.


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