The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 2021

Filed:

Dec. 09, 2019
Applicant:

GE Precision Healthcare Llc, Wauwatosa, WI (US);

Inventor:

Sridhar Nuthi, Waukesha, WI (US);

Assignee:

GE Precision Healthcare LLC, Wauwatosa, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2017.01); G06K 9/62 (2006.01); G16H 30/40 (2018.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); G06K 9/6256 (2013.01); G06K 9/6262 (2013.01); G16H 30/40 (2018.01); G06T 2207/20081 (2013.01); G06T 2207/30242 (2013.01);
Abstract

A method for detecting anomalies in a system. The method includes collecting training data from the system, converting the training data into training images using an image generator, and designating each of the training images as corresponding to events for the system, where the events are at least one of an expected normal event and a non-normal event. The method further includes generating an image recognition model based on the training images and the designations thereof. The method further includes collecting new data from the system, converting the new data into input images, and analyzing the input images using the image recognition model to determine which of the events for the system are represented in the input images, where the anomalies are detected when the input images are determined to at least one of represent a non-normal event and fail to represent an expected normal event.


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