The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 2021

Filed:

Sep. 12, 2018
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Kumar anandabairavasamy Anand, Richmond, CA;

Wittmeir Manfred, Aichach, DE;

Jeffrey Eric, Richmond, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/50 (2006.01); G06T 7/13 (2017.01); G02B 27/01 (2006.01); H04N 5/14 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 5/50 (2013.01); G02B 27/01 (2013.01); G06T 7/0002 (2013.01); G06T 7/13 (2017.01); H04N 5/142 (2013.01); G06T 2207/30168 (2013.01);
Abstract

Provided is a circuit device that can appropriately detect an error in a display image in a head up display, an electronic apparatus, an error detection method, and the like. The circuit device includes an image processing circuit and a comparison circuit. The image processing circuit performs first mapping processing, which maps an input first image on a second image to be projected onto a projection target object, and second mapping processing, which converts the second image to a third image. The second mapping processing is reverse mapping processing of the first mapping processing. The comparison circuit performs comparison between the first image and the third image, and outputs the result of comparison as information for performing error detection on the second image.


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