The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 2021

Filed:

Oct. 23, 2018
Applicant:

Ebay Inc., San Jose, CA (US);

Inventors:

Jonathan Su, San Jose, CA (US);

Mihir Naware, Redwood City, CA (US);

Jatin Chhugani, Santa Clara, CA (US);

Neelakantan Sundaresan, Mountain View, CA (US);

Assignee:

eBay Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 30/06 (2012.01);
U.S. Cl.
CPC ...
G06Q 30/0621 (2013.01); G06Q 30/0643 (2013.01);
Abstract

Techniques for mapping size information associated with a client to target brands, garments, sizes, shapes, and styles for which there is no standardized correlation. The size information associated with a client may be generated by modeling client garments, accessing computer aided drawing (CAD) files associated with client garments, or by analyzing a history of garment purchases associated with the client. Information for target garments may be generated in a similar fashion. A system may then create a standardized scale with a set of sizes for a target, and map a client base size to that standardized size scale. Similar matching and mapping may also be done with shape and style considerations. A recommendation based on the mapping may then be communicated to the client.


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