The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 2021
Filed:
Oct. 06, 2020
Sas Institute Inc., Cary, NC (US);
Pelin Cay, Raleigh, NC (US);
Nabaruna Karmakar, Morrisville, NC (US);
Natalia Summerville, Cary, NC (US);
Varunraj Valsaraj, Cary, NC (US);
Antony Nicholas Cooper, Knoxville, TN (US);
Steven Joseph Gardner, Cary, NC (US);
Joshua David Griffin, Harrisburg, NC (US);
SAS INSTITUTE INC., Cary, NC (US);
Abstract
Manufacturing processes can be optimized using machine learning models. For example, a system can execute an optimization model to identify a recommended set of values for configurable settings of a manufacturing process associated with an object. The optimization model can determine the recommended set of values by implementing an iterative process using an objective function. Each iteration of the iterative process can include selecting a current set of candidate values for the configurable settings from within a current region of a search space defined by the optimization model; providing the current set of candidate values as input to a trained machine learning model that can predict a value for a target characteristic of the object or the manufacturing process based on the current set of candidate values; and identifying a next region of the search space to use in a next iteration of the iterative process based on the value.