The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 2021

Filed:

Jun. 20, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Bong Jun Ko, Harrington Park, NJ (US);

Christian Makaya, Yorktown Heights, NY (US);

Jorge J. Ortiz, Yorktown Heights, NY (US);

Swati Rallapalli, Ossining, NY (US);

Dinesh C. Verma, New Castle, NY (US);

Xiping Wang, Scarsdale, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 7/00 (2006.01); G06F 16/28 (2019.01); G06F 16/951 (2019.01); G06N 5/00 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 7/005 (2013.01); G06F 16/285 (2019.01); G06F 16/951 (2019.01); G06N 5/003 (2013.01); G06N 20/00 (2019.01);
Abstract

A provenance method, system, and non-transitory computer readable medium for a plurality of eidetic systems having logs, include a log-segment clustering circuit configured to crawl the logs of each of the eidetic systems to cluster segments across the logs of temporally correlated events into clustered segments, a probabilistic interleaving circuit configured to analyze the correlated segments to interleave an order of processes in the logs and assign a probability to the order of the processes occurring, and a probabilistic linearization circuit configured to create a probability tree which includes a total probability that a process in the clustered segments causes a next process in the clustered segments until an end of the temporal event of the clustered segments for each of the interleaved order of processes interleaved by the probabilistic interleaving circuit.


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