The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 2021
Filed:
May. 13, 2020
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Manuel Beck, Kirchheim unter Teck, DE;
Marvin von der Ehe, Herrenberg, DE;
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/392 (2020.01); G01R 31/3177 (2006.01); G06F 30/333 (2020.01); G06F 119/12 (2020.01); G06F 119/02 (2020.01);
U.S. Cl.
CPC ...
G06F 30/333 (2020.01); G01R 31/3177 (2013.01); G06F 30/392 (2020.01); G06F 2119/02 (2020.01); G06F 2119/12 (2020.01);
Abstract
Semiconductor device design automation by receiving an initial semiconductor design, identifying scannable cells according to the semiconductor design, determining scannable cell locations, identifying a cluster of scannable cells among the scannable cells according to the locations, forming a scan chain configured to connect at least some of the scannable cells of the cluster, identifying a scan chain cluster including the scan chain logical connections; and generating a scan chain scan-multiplexer location for scan chain clusters.