The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 2021

Filed:

Jul. 09, 2019
Applicant:

Oracle International Corporation, Redwood Shores, CA (US);

Inventors:

Kenny C. Gross, Escondido, CA (US);

Michael H. S. Dayringer, Union City, CA (US);

Andrew J. Lewis, Litchfield, NH (US);

Guang C. Wang, San Diego, CA (US);

Assignee:

Oracle International Corporation, Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/44 (2013.01); G06F 21/76 (2013.01);
U.S. Cl.
CPC ...
G06F 21/44 (2013.01); G06F 21/76 (2013.01);
Abstract

The disclosed embodiments provide a system that detects unwanted electronic components in a target asset. During operation, the system generates a sinusoidal load for the target asset. Next, the system obtains target electromagnetic interference (EMI) signals by monitoring EMI signals generated by the target asset while the target asset is executing the sinusoidal load. The system then generates a target EMI fingerprint from the target EMI signals. Finally, the system compares the target EMI fingerprint against a reference EMI fingerprint for the target asset to determine whether the target asset contains unwanted electronic components.


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