The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 2021
Filed:
Apr. 30, 2015
Vmware, Inc., Palo Alto, CA (US);
Mazda A. Marvasti, Coto de Caza, CA (US);
Ashot Nshan Harutyunyan, Yerevan, AM;
Naira Movses Grigoryan, Yerevan, AM;
Arnak Poghosyan, Yerevan, AM;
VMware, Inc., Palo Alto, CA (US);
Abstract
Methods and systems that estimate a degree of abnormality of a complex system based on historical time-series data representative of the complex system's past behavior and using the historical degree of abnormality to determine whether or not a degree of abnormality determined from current time-series data representative of the same complex system's current behavior is worthy of attention. The time-series data may be metric data that represents behavior of a complex system as a result of successive measurements of the complex system made over time or in a time interval. A degree of abnormality represents the amount by which the time-series data violates a threshold. The larger the degree of abnormality of the current time-series data is from the historical degree of abnormality, the larger the violation of the thresholds and the greater the probability the violation in the current time-series data is worthy of attention.