The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 2021

Filed:

Jun. 12, 2020
Applicant:

Nvidia Corporation, Santa Clara, CA (US);

Inventors:

David Augustus Hart, Salt Lake City, UT (US);

Matthew Milton Pharr, Oakland, CA (US);

Thomas Müller, Rheinfelden, DE;

Ward Lopes, Redwood City, CA (US);

Morgan McGuire, Williamstown, MA (US);

Peter Schuyler Shirley, Salt Lake City, UT (US);

Assignee:

NVIDIA Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/00 (2006.01); G06F 17/17 (2006.01); G06T 3/00 (2006.01); G06N 3/08 (2006.01); G06N 3/04 (2006.01);
U.S. Cl.
CPC ...
G06F 17/17 (2013.01); G06N 3/04 (2013.01); G06N 3/08 (2013.01); G06T 3/0093 (2013.01); G06T 11/00 (2013.01);
Abstract

Sampling a function is used for many applications, such as rendering images. The challenge is how to select the best samples to minimize computations and produce accurate results. An alternative is to use a larger number of samples that may not be carefully selected in an attempt to increase accuracy. For a function that is an integral, such as functions used to render images, a sample distribution may be computed by inverting the integral. Unfortunately, for many integrals, it is neither easy nor practical to compute the inverted integral. Instead, warp functions may be combined to provide a sample distribution that accurately approximates the factors of the product being integrated. Each warp function approximates an inverted term of the product while accounting for the effects of warp functions approximating other factors in the product. The selected warp functions are customized or 'fitted' to implement importance sampling for the approximated product.


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