The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11055213 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 06, 2021

Filed:

Nov. 06, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Lei Gao, Xian, CN;

Jin Wang, Xian, CN;

Kai Li, Xian, CN;

Dong Hai Yu, Xian, CN;

Rui Wang, Xian, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3692 (2013.01); G06F 11/3664 (2013.01); G06F 11/3688 (2013.01);
Abstract

Facilitating localization of code defect of an application includes receiving a set of element-value pairs generated by running the application with a test case. Further differences are identified between the set of element-value pairs and a baseline data result for the test case. Tree maps associated with respective elements are displayed in the set of element-value pairs, each of the tree maps representing relationship of code entities of the application related to its associated element, wherein one or more of the tree maps are marked out to show the differences thereby identifying potential defective codes of the application that have caused the differences.


Find Patent Forward Citations

Gao, Lei. (2021). Facilitating localization of code defect (U.S. Patent No. 11055213). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11055213

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