The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 2021

Filed:

Oct. 05, 2018
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventor:

David Peter Foley, Sugar Land, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1016 (2013.01); G06F 11/0721 (2013.01); G06F 11/0763 (2013.01); G06F 11/1044 (2013.01); G06F 11/1076 (2013.01);
Abstract

Methods, apparatus, systems and articles of manufacture are disclosed for safety mechanisms to actively detect address faults. An example system includes a first parity generator, a second parity generator, and a parity checker. The first parity generator is to generate a first parity based on a first address information. The first address information corresponds to a desired location to store data in a memory storage array. The second parity generator is to generate a second parity based on a second address information. The second address information corresponding to an actual location where the data is stored in the memory storage array. The parity checker is to compare the first parity and the second parity to detect a fault.


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