The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 2021

Filed:

Aug. 02, 2018
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Nickolay Dalmatov, St. Petersburg, RU;

Michael P. Wahl, Bulverde, TX (US);

Jian Gao, Beijing, CN;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0647 (2013.01); G06F 3/0616 (2013.01); G06F 3/0689 (2013.01); G06F 3/06 (2013.01);
Abstract

A method, computer program product, and computing system for managing wear balance in a mapped RAID storage system. According to embodiments, mapped RAID extents, which are comprised of storage disk extents, are assigned to particular mapped RAID groups based on one or more parameters related to wear experienced by disk extents associated with the RAID extent. Endurance parameters are measured and can be used by machine learning modules to predict future wear levels enabling predictive wear balancing in mapped RAID storage systems. Embodiments can be used when initially forming a mapped RAID group, when adding storage to an existing mapped RAID group, or when managing the ongoing performance of a mapped RAID group or storage system.


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