The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 2021
Filed:
Dec. 21, 2018
Mission Support and Test Services, Llc, Las Vegas, NV (US);
Mary D. O'Neill, Santa Barbara, CA (US);
David Terry, Santa Barbara, CA (US);
Mission Support and Test Services, LLC, North Las Vegas, NV (US);
Abstract
A compact adaptive optics system for long-range horizontal paths imaging that improves degraded images. The system uses a filter that corresponds to the three colors in a typical color detector element, one or more optic elements, a deformable mirror, and a detector. Focus errors, due to turbulence, in the image recorded by the detector element show up as image shifts in the three distinct color images. The shifts and statistics of these shifts between these simultaneous images are used to create control signals for the deformable mirror resulting in a compact adaptive optic system for horizontal paths without need for a point source located at the distance scene being imaged. Analysis of the relative pixel shifts in various regions of the image provides third order statistics revealing tip/tilt and additional Zernikes modes that are used to control a deformable mirror without the need for a guide star/point-source.