The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 2021
Filed:
Oct. 24, 2017
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Assignee:
Samsung Electronics Co., Ltd., Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G06F 1/3206 (2019.01); G06F 1/3209 (2019.01); G06F 1/3296 (2019.01); G06F 1/26 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2853 (2013.01); G06F 1/26 (2013.01); G06F 1/3206 (2013.01); G06F 1/3209 (2013.01); G06F 1/3296 (2013.01); G01R 31/2884 (2013.01);
Abstract
A semiconductor device and a method of testing the same are provided. A semiconductor device includes a Design Under Test (DUT), a processing core configured to execute test software to determine an optimum operating voltage of the DUT, and a protection circuit configured to block the transmission of undefined signals generated by the DUT while the processing core executes the test software.
Quick Actions:
Cho, Joon. (2021). Semiconductor device and method of testing the same (U.S. Patent No. 11054462). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11054462
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile