The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 2021
Filed:
Mar. 06, 2018
Applicant:
Osaka University, Osaka, JP;
Inventor:
Shintarou Hisatake, Osaka, JP;
Assignee:
Osaka University, Osaka, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/08 (2006.01);
U.S. Cl.
CPC ...
G01R 29/0885 (2013.01);
Abstract
An electromagnetic wave measurement apparatus includes: a probe light generation unit configured to generate probe light of two wavelengths; and an electro-optic probe configured to receive the probe light generated by the probe light generation unit and a detection target electromagnetic wave, wherein the probe light generation unit performs a fluctuation operation to cause a frequency difference of the probe light to fluctuate, and the content of the fluctuation operation is set so as to conform to specifications regarding frequency fluctuation of the detection target electromagnetic wave.