The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 2021

Filed:

Dec. 02, 2016
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Yuya Matsuoka, Tokyo, JP;

Akihisa Makino, Tokyo, JP;

Hajime Yamazaki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 35/02 (2006.01); G01N 35/10 (2006.01); G01N 35/00 (2006.01); G01N 35/04 (2006.01); G01N 21/01 (2006.01); G01N 33/86 (2006.01); G01N 33/48 (2006.01); G01N 1/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/025 (2013.01); G01N 35/00 (2013.01); G01N 35/0092 (2013.01); G01N 35/02 (2013.01); G01N 35/026 (2013.01); G01N 35/1004 (2013.01); G01N 1/00 (2013.01); G01N 21/01 (2013.01); G01N 33/48 (2013.01); G01N 33/86 (2013.01); G01N 35/10 (2013.01); G01N 35/1002 (2013.01); G01N 2035/00316 (2013.01); G01N 2035/0437 (2013.01);
Abstract

An automated analyzer has a reaction disk on which a plurality of reaction vessels capable of holding sample and reagent mixtures can be placed, a first cover for covering at least a portion of the area above the reaction disk, a second cover that can be opened and closed independently from the first cover, at least one sensor for monitoring the opening and closing of the first cover, and a control unit for monitoring a signal from the sensor and carrying out control such that if the first cover has not been opened and closed during the period until a new analysis operation is started, a pre-analysis cleaning operation, blank measurement operation, or both, are skipped.


Find Patent Forward Citations

Matsuoka, Yuya. (2021). Automated analyzer and control method for same (U.S. Patent No. 11054433). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11054433

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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