The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 2021

Filed:

Aug. 08, 2018
Applicant:

Sysmex Corporation, Kobe, JP;

Inventors:

Shohei Matsumoto, Kobe, JP;

Chikako Murata, Kobe, JP;

Kenichiro Suzuki, Kobe, JP;

Assignee:

Sysmex Corporation, Kobe, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/14 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1429 (2013.01); G01N 15/147 (2013.01); G01N 15/1468 (2013.01); G06K 9/00134 (2013.01); G01N 2015/1486 (2013.01);
Abstract

In view of such problems, the present invention provides a sample processing apparatus, a sample processing system, and a method of calculating measurement time, which allow an operator to efficiently capture images of cells. This invention relates to a sample processing apparatusfor measuring and analyzing a measurement sample. The sample processing apparatusincludes a light sourcethat irradiates light to the measurement sample, an imaging unitthat images light generated from the measurement sampleby irradiation with light, concentration information of cells included in the measurement sampleAnd a processing unitthat calculates a time required for cell imaging. The required time includes the time required for the processing of the image captured by the imaging unitand the time required for the analysis of the image processed by the imaging unit


Find Patent Forward Citations

Loading…