The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 2021
Filed:
Oct. 24, 2017
Malvern Panalytical Limited, Malvern, GB;
Jason Cecil William Corbett, Malvern, GB;
David Bryce, Malvern, GB;
Malvern Panalytical Limited, Malvern, GB;
Abstract
A particle characterisation apparatus comprising: a light source for illuminating a sample with a light beam; a detector arranged to detect scattered light from the interaction of the light beam with the sample; a focus tuneable lens arranged to collect the scattered light for the detector from a scattering volume and/or to direct the light beam into the sample, a sample holder with an opposed pair of electrodes and configured to hold a sample in position in a measurement volume between the pair of electrodes such that a planar surface of the sample is aligned orthogonally to the electrode surfaces, the planar surface adjacent to the scattering volume, wherein adjustment of the focus tuneable lens results in adjustment of the relative position of the planar surface and the scattering volume by moving the scattering volume.