The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 2021

Filed:

Jul. 26, 2019
Applicant:

Hitachi Metals, Ltd., Tokyo, JP;

Inventors:

Yasuyuki Okuma, Tokyo, JP;

Masaru Kokubo, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/24 (2006.01); G01D 5/243 (2006.01); G01R 27/26 (2006.01); H01B 3/00 (2006.01);
U.S. Cl.
CPC ...
G01D 5/2405 (2013.01); G01D 5/243 (2013.01); G01R 27/2605 (2013.01); H01B 3/004 (2013.01);
Abstract

A detection device has a pinching sensor and a detecting unit. The pinching sensor has a dielectric layer in which a linear conductor layer is formed, and conductor layers arranged on top and bottom surfaces of the dielectric layer, a slit being formed on at least one of the conductor layers arranged on the top and bottom surfaces. The detecting unit supplies a high-frequency signal to an input portion of the linear conductor layer, generates an electric field around a slit portion of the conductor layer on which the slit is formed, and detects a change in a reflection coefficient at the input portion, the change being caused by a change of the electric field generated by interference with a detected object.


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