The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 2021
Filed:
Sep. 05, 2018
Arrayjet Limited, Lothian, GB;
Benjamin Mitchell, Northumberland, GB;
Joan Salvatella Serra, Edinburgh, GB;
ARRAYJET LIMITED, Lothian, GB;
Abstract
Method for manufacturing microarrays and verifying the quality of said microarrays, wherein the method comprises: a) providing at least one reagent, b) loading said at least one reagent in a dispensing print head, in a predetermined arrangement, c) in a first print pass, generating instructions for the print head and moving said print head with respect to a substrate to print said at least one reagent on the substrate to obtain microarrays, d) obtaining an image of the printed microarrays by means of a camera, e) processing the obtained images of the printed microarrays, to calculate parameters indicative for the quality of the printed microarrays, f) comparing, at the end of the first print pass, the calculated parameters for the printed microarrays with predetermined criteria for the microarrays, to identify possible printing defects, g) comparing, for the printed microarrays, the identified printing defects of step f), h) using the outcome of the comparison of step g) to select a corrective action to improve the quality of the microarrays, prior to the printing of a subsequent print pass.