The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 2021

Filed:

Dec. 07, 2020
Applicant:

Bertec Corporation, Columbus, OH (US);

Inventors:

Necip Berme, Worthington, OH (US);

Jaswandi Tushar Pitale, Plain City, OH (US);

Cameron Scott Hobson, Powell, OH (US);

Mohan Chandra Baro, Columbus, OH (US);

Fernando Vanderlinde dos Santos, Columbus, OH (US);

Assignee:

Bertec Corporation, Columbus, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2018.01); A63B 24/00 (2006.01); G01L 1/22 (2006.01); G01L 1/20 (2006.01); A63B 22/02 (2006.01); A63B 26/00 (2006.01); A63B 71/06 (2006.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
A63B 24/0062 (2013.01); A63B 22/02 (2013.01); A63B 26/003 (2013.01); A63B 71/0622 (2013.01); G01L 1/205 (2013.01); G01L 1/22 (2013.01); G06N 3/08 (2013.01); A63B 2071/0652 (2013.01); A63B 2220/05 (2013.01); A63B 2220/24 (2013.01); A63B 2220/51 (2013.01); A63B 2220/56 (2013.01); A63B 2220/803 (2013.01); A63B 2220/807 (2013.01);
Abstract

A force measurement system is disclosed herein. The force measurement system includes a force measurement assembly configured to receive a subject thereon, and one or more data processing devices operatively coupled to the force measurement assembly. In one or more embodiments, the one or more data processing devices are operatively coupled to the force measurement assembly, the one or more data processing devices configured to receive one or more signals that are representative of forces and/or moments being applied to a top surface of the force measurement assembly by the subject, and to convert the one or more signals into output forces and/or moments, the one or more data processing devices further configured to predict one or more balance parameters of the subject using a trained neural network.


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