The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 2021
Filed:
Mar. 04, 2020
Applicant:
Shimadzu Corporation, Kyoto, JP;
Inventor:
Fumiaki Tanaka, Kyoto, JP;
Assignee:
Shimadzu, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); A61B 6/02 (2006.01); A61B 6/00 (2006.01); A61B 6/04 (2006.01);
U.S. Cl.
CPC ...
A61B 6/487 (2013.01); A61B 6/025 (2013.01); A61B 6/0487 (2020.08); A61B 6/4441 (2013.01); A61B 6/5205 (2013.01);
Abstract
This X-ray fluoroscopic imaging apparatus is provided with an image processing unit that corrects magnification of a plurality of X-ray images based on first height information and generates a first long image by stitching the images together. The image processing unit is configured to generate a second long image in which the magnification of the plurality of X-ray images is corrected based on second height information upon acceptance of an input of second height information after generating the first long image.
Tanaka, Fumiaki. (2021). X-ray fluoroscopic imaging apparatus (U.S. Patent No. 11051778). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11051778
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile