The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 2021

Filed:

Apr. 21, 2017
Applicant:

New York University, New York, NY (US);

Inventors:

Riccardo Lattanzi, New York, NY (US);

Daniel K. Sodickson, New York, NY (US);

José E. Cruz Serralles, Cambridge, MA (US);

Athanasios Polymeridis, Moscow, RU;

Luca Daniel, Cambridge, MA (US);

Jacob K. White, Cambridge, MA (US);

Assignee:

New York University, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/055 (2006.01); G01R 33/46 (2006.01); A61B 1/00 (2006.01); A61B 5/00 (2006.01); G01R 33/48 (2006.01); G01R 33/24 (2006.01); G01R 33/56 (2006.01);
U.S. Cl.
CPC ...
A61B 5/055 (2013.01); A61B 1/00011 (2013.01); A61B 5/0004 (2013.01); A61B 5/0013 (2013.01); G01R 33/246 (2013.01); G01R 33/4616 (2013.01); G01R 33/48 (2013.01); G01R 33/56 (2013.01); A61B 2576/02 (2013.01);
Abstract

A plurality of stimulations is transmitted to tissue or other material using one or more transmitters. The plurality of signals associated with the excited tissue and the transmitted stimulations are measured. The measured signals are processed to generate field-related quantities, such as B1+ and/or MR signal maps. Field-related quantities are generated also from simulation, by calculating the one or more incident fields from a simulator model of the one or more transmitters and assuming a given distribution of electrical properties in the tissue or other material. Field-related quantities generated from simulation and experimental procedures are compared to each other. The assumed electrical properties distribution is updated and the procedure is repeated iteratively until the difference between simulated and experimental field-related quantities is smaller than a threshold.


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