The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 2021
Filed:
Oct. 31, 2012
Koninklijke Philips N.v., Eindhoven, NL;
Bernardus Hendrikus Wilhelmus Hendriks, Eindhoven, NL;
Waltherus Cornelis Bierhoff, Veldhoven, NL;
Nenad Mihajlovic, Eindhoven, NL;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
An optical microscopy probe for scanning microscopy imaging of object has a housing with an optical window at a side position at the distal end of the housing, and an optical guide having an objective lens rigidly coupled to an end portion of the optical guide. The optical guide is displaceably mounted in a transverse direction of the housing so as to enable optical scanning in a region of interest. A relay lens unit is rigidly mounted at the distal end of the probe and it has a first lens, a second lens and a mirror. The relay lens unit is optically arranged relative to the objective lens for allowing scanning microscopy through the optical window at the side of the distal end of the housing.